发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
摘要 PROBLEM TO BE SOLVED: To form shallow bonding source/drain for a p-channel type field effect transistor employing strain Si technology. SOLUTION: A p-type diffusion region 5c mainly constituting the source/drain of a pMIS1p is formed of p<SP>+</SP>-SiGe/p-SiGe:C/p<SP>-</SP>-SiGe, while p-type impurity of relatively high concentration is introduced into p<SP>+</SP>-SiGe and the p-type impurity of a relatively low concentration is introduced into the p<SP>-</SP>-SiGe. It is necessary to introduce the p-type impurity of relatively high concentration to reduce a contact resistance. The depth of the p-type diffusion region 5c, however, is maintained so as to be shallow since the diffusion thereof is suppressed by the p-SiGe:C. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007165665(A) 申请公布日期 2007.06.28
申请号 JP20050361181 申请日期 2005.12.15
申请人 RENESAS TECHNOLOGY CORP 发明人 EGUCHI SOJI;MIYASHITA ISAO;KANAI AKIRA
分类号 H01L29/78;H01L21/8238;H01L27/092;H01L29/786 主分类号 H01L29/78
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