| 摘要 |
PROBLEM TO BE SOLVED: To test a built-in memory and a logic block in an LSI with a mixedly-loaded memory/logic by using a memory tester. SOLUTION: A test operation is designated by a switching signal NR/TE, to thereby switch transfer switches 3-7 to the terminal T side, and a test mode A is designated by the switching signal TA/TB, to thereby switch a transfer switch 8 to the terminal A side. Test input data are inputted from an input terminal 11 and stored in a FIFO memory 2. Then, a test mode B is designated by the switching signal TA/TB, to thereby switch the transfer switch 8 to the terminal B side, and the test input data are read out from the FIFO memory 2 and imparted to the logic block 1, and a processing result outputted from the logic block 1 is stored in the FIFO memory 2 as test output data. Thereafter, the test output data in the FIFO memory 2 are read out after returning to the test mode A, and outputted from an output terminal 12, and the data are compared with expected value data, to thereby determine acceptance. COPYRIGHT: (C)2007,JPO&INPIT
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