发明名称 Manufacturing method of semiconductor device
摘要 To provide a manufacturing method of a semiconductor device with a reduced chip area by reducing the size of a pattern for forming an integrated circuit. For example, the size of an IC chip that is provided as an application of IC cards or IC tags can be reduced. The manufacturing method includes the steps of forming a gate electrode; forming an insulating layer over the gate electrode; and forming an opening in the insulating layer. One or both of the step of forming the gate electrode and the step of forming the opening in the insulating layer is/are conducted by a lithography process using a phase-shift mask or a hologram mask. Accordingly, micropatterns can be formed even over a substrate with low planarity such as a glass substrate.
申请公布号 US2007148936(A1) 申请公布日期 2007.06.28
申请号 US20060645521 申请日期 2006.12.27
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 OHNUMA HIDETO
分类号 H01L21/3205 主分类号 H01L21/3205
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