发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 A nonvolatile semiconductor memory device is provided to perform a high speed read operation without an operation error and being influenced by noise of adjacent bits. In a nonvolatile semiconductor memory device having a main memory and a management memory accumulated with condition data for internal processing to perform operation management of the main memory, one bit of the management memory is constituted by a plurality of memory cells. The memory cells are arranged in a line along a word line(18), and deployed in an array along the direction of word lines and bit lines. The word line performs a read operation by a word driver(19), and the bit line performs a read operation by transferring an output signal to a read circuit(14) through a bit line selection transistor. One side memory cell of adjacent bits is not selected during the read operation.
申请公布号 KR20070066840(A) 申请公布日期 2007.06.27
申请号 KR20060080685 申请日期 2006.08.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIDO KAZUNARI;KAWAMURA SHOICHI
分类号 G11C16/00;G11C16/08;G11C16/24;G11C16/26 主分类号 G11C16/00
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