发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE |
摘要 |
A nonvolatile semiconductor memory device is provided to perform a high speed read operation without an operation error and being influenced by noise of adjacent bits. In a nonvolatile semiconductor memory device having a main memory and a management memory accumulated with condition data for internal processing to perform operation management of the main memory, one bit of the management memory is constituted by a plurality of memory cells. The memory cells are arranged in a line along a word line(18), and deployed in an array along the direction of word lines and bit lines. The word line performs a read operation by a word driver(19), and the bit line performs a read operation by transferring an output signal to a read circuit(14) through a bit line selection transistor. One side memory cell of adjacent bits is not selected during the read operation.
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申请公布号 |
KR20070066840(A) |
申请公布日期 |
2007.06.27 |
申请号 |
KR20060080685 |
申请日期 |
2006.08.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIDO KAZUNARI;KAWAMURA SHOICHI |
分类号 |
G11C16/00;G11C16/08;G11C16/24;G11C16/26 |
主分类号 |
G11C16/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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