发明名称 Lithographic apparatus and device manufacturing method using interferometric and maskless exposure units
摘要 A lithographic system combining an interference exposure unit (10) and a lithography unit. The lithography unit can comprise an array of individually controllable elements (PD). The lithography system can be arranged such that a pitch of the lines exposed by the interference exposure unit is an integer multiple of a size of an exposure area of the lithography unit corresponding to a single individually controllable element.
申请公布号 EP1801655(A2) 申请公布日期 2007.06.27
申请号 EP20060256212 申请日期 2006.12.06
申请人 ASML NETHERLANDS B.V. 发明人 TROOST, KARS ZEGER;BLEEKER, ARNO JAN
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项
地址