发明名称 |
Lithographic apparatus and device manufacturing method using interferometric and maskless exposure units |
摘要 |
A lithographic system combining an interference exposure unit (10) and a lithography unit. The lithography unit can comprise an array of individually controllable elements (PD). The lithography system can be arranged such that a pitch of the lines exposed by the interference exposure unit is an integer multiple of a size of an exposure area of the lithography unit corresponding to a single individually controllable element.
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申请公布号 |
EP1801655(A2) |
申请公布日期 |
2007.06.27 |
申请号 |
EP20060256212 |
申请日期 |
2006.12.06 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
TROOST, KARS ZEGER;BLEEKER, ARNO JAN |
分类号 |
G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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