发明名称 METHOD AND APPARATUS FOR TESTING HARDWARE DEVICES IN ELECTRIC SYSTEM
摘要 A method and a device for testing hardware devices of an electric device are provided to output a test result to easily check an abnormal state while testing each hardware device with minimum hardware resources. A memory(23) stores a hardware test program. A controller(22) processes a test for each hardware device(21) by executing the hardware test program and generates a signal having a frequency corresponding to the hardware device generating an error if a test request signal is received. The frequency is differently set to each hardware device.
申请公布号 KR20070066132(A) 申请公布日期 2007.06.27
申请号 KR20050126939 申请日期 2005.12.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, YOUNG MIN
分类号 G06F11/16 主分类号 G06F11/16
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