发明名称 |
METHOD AND APPARATUS FOR TESTING HARDWARE DEVICES IN ELECTRIC SYSTEM |
摘要 |
A method and a device for testing hardware devices of an electric device are provided to output a test result to easily check an abnormal state while testing each hardware device with minimum hardware resources. A memory(23) stores a hardware test program. A controller(22) processes a test for each hardware device(21) by executing the hardware test program and generates a signal having a frequency corresponding to the hardware device generating an error if a test request signal is received. The frequency is differently set to each hardware device.
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申请公布号 |
KR20070066132(A) |
申请公布日期 |
2007.06.27 |
申请号 |
KR20050126939 |
申请日期 |
2005.12.21 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, YOUNG MIN |
分类号 |
G06F11/16 |
主分类号 |
G06F11/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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