发明名称 Methods for making nearly planar dielectric films in integrated circuits
摘要 In the fabrication of integrated circuits, one specific technique for making surfaces flat is chemical-mechanical planarization. However, this technique is quite time consuming and expensive, particularly as applied to the numerous intermetal dielectric layers-the insulative layers sandwiched between layers of metal wiring-in integrated circuits. Accordingly, the inventor devised several methods for making nearly planar intermetal dielectric layers without the use of chemical-mechanical planarization and methods of modifying metal layout patterns to facilitate formation of dielectric layers with more uniform thickness. These methods of modifying metal layouts and making dielectric layers can be used in sequence to yield nearly planar intermetal dielectric layers with more uniform thickness.
申请公布号 US7235865(B2) 申请公布日期 2007.06.26
申请号 US20040926471 申请日期 2004.08.26
申请人 MICRON TECHNOLOGY, INC. 发明人 JUENGLING WERNER
分类号 H01L21/3205;H01L23/58;H01L21/3105;H01L21/316;H01L21/4763;H01L21/76;H01L21/768 主分类号 H01L21/3205
代理机构 代理人
主权项
地址