发明名称 Method for setting erasing pulses and screening erasing defects of nonvolatile memory
摘要 Method for determining the number of applications of erasing pulses, including extracting two pairs of the accumulated number of the erasing pulses Np and the ratio Re of the number of erased memory cells in the target block to be erased after the accumulated number of the erasing pulses Np has been applied, converting the two ratios Re into normalized variables S(Re) through normalizing the random variables of the normal distribution probability with standard deviations, converting the two accumulated numbers of the erasing pulses Np into common logarithms Log(Np), calculating a common logarithm Log(Nt) through extrapolating from two sets of coordinates [Log(Np), S(Re)], and determining the number of applications of the remaining erasing pulses so that the extrapolation erasing pulse number Nt is the target accumulated number of applications of erasing pulses.
申请公布号 US7236405(B2) 申请公布日期 2007.06.26
申请号 US20050251453 申请日期 2005.10.14
申请人 SHARP KABUSHIKI KAISHA 发明人 UEDA NAOKI
分类号 G11C11/34;G11C16/04 主分类号 G11C11/34
代理机构 代理人
主权项
地址