发明名称 |
Conductor treating single-wafer type treating device and method for semi-conductor treating |
摘要 |
A single-substrate processing apparatus ( 20 ) has a worktable ( 40 ) disposed in a process chamber ( 24 ), which accommodates a target substrate (W). The worktable ( 40 ) has a thermally conductive mount surface ( 41 ) to place the target substrate (W) thereon. The worktable ( 40 ) is provided with a flow passage ( 50 ) formed therein, in which a thermal medium flows for adjusting temperature of the target substrate (W) through the mount surface ( 41 ). The flow passage ( 50 ) is connected to a thermal medium supply system ( 54 ), which selectively supplies a cooling medium and a heating medium.
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申请公布号 |
US7235137(B2) |
申请公布日期 |
2007.06.26 |
申请号 |
US20030466116 |
申请日期 |
2003.07.23 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
KITAYAMA HIROFUMI;MATSUSHIMA NORIAKI |
分类号 |
C23C16/46;H01L21/302;B44C1/22;C03C15/00;C23C16/00;C23C16/511;C23F1/00;C30B31/14;C30B31/16;H01L21/00;H01L21/28;H01L21/306;H01L21/3065;H01L21/324;H01L21/768 |
主分类号 |
C23C16/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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