发明名称 Semiconductor device and method of fabricating the same
摘要 There is provided a crystalline TFT in which reliability comparable to or superior to a MOS transistor can be obtained and excellent characteristics can be obtained in both an on state and an off state. A gate electrode of the crystalline TFT is formed of a laminate structure of a first gate electrode made of a semiconductor material and a second gate electrode made of a metal material. An n-channel TFT includes an LDD region, and a region overlapping with the gate electrode and a region not overlapping with the gate electrode are provided, so that a high electric field in the vicinity of a drain is relieved, and at the same time, an increase of an off current is prevented.
申请公布号 US7235810(B1) 申请公布日期 2007.06.26
申请号 US19990454146 申请日期 1999.12.03
申请人 发明人
分类号 H01L29/04;G02F1/1362;G02F1/1368;H01L21/28;H01L21/77;H01L21/84;H01L27/12;H01L29/49;H01L29/786 主分类号 H01L29/04
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