发明名称 HDPCVD process and method for improving uniformity of film thickness
摘要 A high density plasma chemical vapor deposition (HDPCVD) process is disclosed. First, a first deposition step is performed on a wafer. Then, the wafer is rotated with an angle. A second deposition step is performed for completing the deposition. By the rotation of the wafer, the thin film is formed with a desired uniformity.
申请公布号 US7235496(B2) 申请公布日期 2007.06.26
申请号 US20040711512 申请日期 2004.09.23
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LU CHIEN-HUNG;SU CHIN-TA
分类号 H01L21/31 主分类号 H01L21/31
代理机构 代理人
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