发明名称 Scanning mirror unit and beam scanning probe
摘要 A scanning mirror unit for scanning a beam comprises: at least one cantilever which is formed by bonding an elastic material and a piezoelectric material together and supported by a base at its one end; and a movable mirror which is supported at least by a free end of the cantilever at its peripheral part. When voltage is applied to the piezoelectric material, the free end of the cantilever moves in a prescribed direction to press and move the peripheral part of the movable mirror while leaving a central part of the movable mirror at substantially the same position to cause a tilt to the movable mirror. With such composition of the scanning mirror unit, a reflecting member having a sufficient thickness (e.g. some hundreds of microns) can be employed for the movable mirror, by which a high power laser beam effective for treatment of affected parts, etc. can be reflected finely and durably.
申请公布号 US7236283(B2) 申请公布日期 2007.06.26
申请号 US20040863382 申请日期 2004.06.09
申请人 HAGA, YOICHI 发明人 KIKUCHI NAOKI;ESASHI MASAYOSHI;HAGA YOICHI;MAEDA MASANORI
分类号 G02B23/26;G02B26/08;A61B1/00;A61B8/12;A61B18/00;A61B18/20;G02B23/24;G02B26/10 主分类号 G02B23/26
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