发明名称 Testing method for permanent electrical removal of an intergrated circuit output after packaging
摘要 An apparatus and method of disconnecting or disabling an input/output terminal of an integrated circuit after packaging. Each input/output terminal of the integrated circuit includes a disabling device coupled thereto between the input/output terminal and the output driver of the respective input/output terminal. A DRAM module is disclosed having a plurality of partially good DRAM devices wherein the known bad input/output terminals are permanently disconnected using a disabling device, both the known good and known bad input/output terminals being coupled to conductive traces of a carrier substrate.
申请公布号 US7237155(B2) 申请公布日期 2007.06.26
申请号 US20050110636 申请日期 2005.04.14
申请人 发明人
分类号 G11C29/00;G11C29/02 主分类号 G11C29/00
代理机构 代理人
主权项
地址