发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To remarkably shorten the entire length of a process while suppressing an increase in propagation delay by mixedly mounting a p-channel transistor and an n-channel transistor on different semiconductor layers. SOLUTION: The n-channel transistor (p-channel transistor) is formed on a semiconductor substrate 11, an insulation film 31 having a concave portion 32 formed thereon is formed on the n-channel transistor (p-channel transistor), an amorphous semiconductor layer 33 is formed on the insulation film 31 so that the inside of the concave portion 32 is filled, and the amorphous semiconductor layer 33 is irradiated with laser to melt and crystallize the amorphous semiconductor layer 33. In this way, a substantially signal crystal semiconductor particle 34 is formed around the concave portion 32, and the p-channel transistor (n-channel transistor) is formed on the substantially single crystal semiconductor particle 34. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007157934(A) 申请公布日期 2007.06.21
申请号 JP20050349588 申请日期 2005.12.02
申请人 SEIKO EPSON CORP 发明人 SHIMADA HIROYUKI;MORI KATSUMI
分类号 H01L29/786;H01L21/20;H01L21/265;H01L21/28;H01L21/336;H01L21/8234;H01L21/8238;H01L27/00;H01L27/088;H01L27/092 主分类号 H01L29/786
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