发明名称 Lithography apparatus and method utilizing pendulum interferometer system
摘要 Reticle and/or wafer stage interferometers are mounted to a supporting body that is separate from the body that supports the projection optical system of a lithography apparatus. This enables the size of the body supporting the projection optical system to be reduced so that it has more favorable dynamic characteristics.
申请公布号 US2007139635(A1) 申请公布日期 2007.06.21
申请号 US20060546368 申请日期 2006.10.12
申请人 NIKON CORPORATION 发明人 BINNARD MICHAEL B.;WATSON DOUGLAS C.;NOVAK W. T.;HORIKAWA HIROTO;NAKAKOJI YOSHIFUMI;SAKAMOTO HIDEAKI
分类号 G03B27/80 主分类号 G03B27/80
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