发明名称 POWER MOSFET AND METHOD OF MAKING THE SAME
摘要 <p>A MOS device (40, 70) comprising first and second N-type source regions (50), electrically in parallel, located in spaced-apart P- type body regions (46), separated by an N-type JFET region (56) at a first surface (45). Channel regions (47) underlying the gate (53) at the first surface (45), extend from the source regions (50) through portions (47) of the body regions (46) to the JFET region (56) which communicates via an N-epi region (44) with an underlying drain region (42). Ion implantation is used to tailor the doping density (86, 92) in the JFET region (56) so that the net active doping concentration (86, 92) in a central portion (X{?) of the JFET region (56) decreases substantially linearly from the first surface (45) toward the underlying N epi region (44). A thickened gate dielectric layer region (72) may be provided on said control portion of the JFET region (56).</p>
申请公布号 WO2007070050(A1) 申请公布日期 2007.06.21
申请号 WO2005US45432 申请日期 2005.12.14
申请人 FREESCALE SEMICONDUCTOR, INC.;DE FRESART, EDOUARD D.;FENG, ZHU-QING;QIN, GANMING;WANG, PEI-LIN;WANG, XIAO-PING;ZHOU, HONG-WEI 发明人 DE FRESART, EDOUARD D.;FENG, ZHU-QING;QIN, GANMING;WANG, PEI-LIN;WANG, XIAO-PING;ZHOU, HONG-WEI
分类号 H01L29/78;H01L21/336;H01L29/08;H01L29/423;H01L29/45;H01L29/49 主分类号 H01L29/78
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