发明名称 NONVOLATILE MEMORY, ITS MANUFACTURING METHOD, AND ITS OPERATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a nonvolatile memory formed on a first conductivity type substrate. SOLUTION: A nonvolatile memory comprises a gate, a second conductivity type drain region, a charge storage layer, and a second conductivity type first lightly doped region. The gate is formed on the first conductivity type substrate. The second conductivity type drain region is formed at the first side part of the gate of the first conductivity type substrate. The charge storage layer is formed at the first side part of the gate of the first conductivity type substrate and between the second conductivity type drain region and the gate. The second conductivity type first lightly doped region is formed at the second side part of the gate of the first conductivity type substrate. The second side part is opposite to the first side part. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007158315(A) 申请公布日期 2007.06.21
申请号 JP20060302428 申请日期 2006.11.08
申请人 EMEMORY TECHNOLOGY INC 发明人 WANG SHIH-CHEN;CHEN HSIN MING;LU CHUN-HUNG;HO MING-CHOU;CHIN SHIKETSU;JO SEISHO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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