发明名称 |
SEMICONDUCTOR MANUFACTURING APPARATUS, METHOD OF DETERMINING ITS PREMAINTENANCE CYCLE, AND ITS PREMAINTENANCE METHOD |
摘要 |
PROBLEM TO BE SOLVED: To properly establish a premaintenance cycle before feeding a semiconductor manufacturing apparatus into a production line in the semiconductor manufacturing apparatus, and to provide a method of determining a premaintenance cycle and a premaintenance method of the semiconductor manufacturing apparatus. SOLUTION: An apparatus includes: a backside wafer housing section 6 capable of housing a backside wafer 5 separating from a wafer 3 for products, in which a mirror plane polishing of a backside is carried out and a mirror plane degree of a front surface is polished to be higher than that of the backside; and a conveyance mechanism 2 which conveys the housed backside wafer 5 onto a stage 1. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007158202(A) |
申请公布日期 |
2007.06.21 |
申请号 |
JP20050354297 |
申请日期 |
2005.12.08 |
申请人 |
FUJITSU LTD |
发明人 |
TAKAHASHI NAOHIRO;YASUMOTO TAMIHIDE |
分类号 |
H01L21/3065;H01L21/304;H01L21/677 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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