<p>A testing apparatus for testing a device to be tested is provided with a driver for outputting a test signal to the device to be tested; a first transmission path for electrically connecting the driver with the device to be tested; a first FET switch provided in the first transmission path for switching to connect or not the driver with the device to be tested; a comparator for comparing the voltage of the output signal of the device to be tested with a previously set reference voltage; a second transmission path, which is branched from between the first FET switch and the device to be tested in the first transmission path and connects the first transmission path with the comparator; and a second FET switch arranged in the second transmission path for switching to connect or not the comparator with the device to be tested.</p>
