| 摘要 |
According to the present invention, there is provided a semiconductor device having: a switching element serially connected to a resistive element to be measured; a plurality of transistors respectively connected in parallel to a series circuit consisting of the resistive element to be measured and the switching element, which will respectively take desired resistance values when turned on; and a measurement section which measures a resistance value of a parasitic resistance which occurs so as to be coupled to the resistive element to be measured by turning off the switching element and then controlling switching operations of the plurality of transistors to change the resistance values of resistors formed by the plurality of transistors, and subsequently measures a resistance value of the resistive element to be measured based on a resistance value of the parasitic resistance by turning on the switching element while turning off the plurality of transistors.
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