| 摘要 |
Disclosed are a flash memory device including a self aligned floating gate array, and a method of forming the self aligned floating gate array for the flash memory device. The flash memory device includes a plurality of device isolation layers formed by the oxidation of a silicon substrate, and a floating gate array formed in active device regions divided by the plurality of device isolation layers and in which sidewalls of the floating gate are self aligned to the plurality of device isolation layers. Therefore, it is possible to minimize the width of the device isolation regions regardless of the minimum line width as defined by process design rules.
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