| 摘要 |
Nanoscale optical probes for use with nanoscale optical microscopy are disclosed herein. A nanoscale optical probe for use with a near-field scanning optical microscope includes an inner conductor having a top end, a bottom end, and a body; a dielectric material engaging the inner conductor; and an outer conductor engaging the dielectric material, wherein the inner conductor is longer at a tip surface of the probe than the dielectric material and the outer conductor.
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