发明名称 |
LIQUID FOR LIQUID IMMERSION EXPOSURE PROCESS, AND METHOD OF FORMING RESIST-PATTERN USING SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for forming a resist pattern using liquid for a liquid immersion exposure process having extremely high transparency, and a refractive index that is higher than that of water at a wavelength range of 200 nm or smaller. <P>SOLUTION: The resist pattern is formed by using the liquid for a liquid immersion exposure process containing a phosphor compound having a specific molecular structure at a wavelength range of 200 nm or smaller. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007157757(A) |
申请公布日期 |
2007.06.21 |
申请号 |
JP20050346774 |
申请日期 |
2005.11.30 |
申请人 |
MITSUBISHI GAS CHEM CO INC |
发明人 |
MATSUMURA KOUEI;KIMURA YOSHIYA;KIYAMA NAOYUKI |
分类号 |
H01L21/027;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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