| 摘要 |
PROBLEM TO BE SOLVED: To perform a highly precise AC test without a high-speed operative LSI tester, in a semiconductor integrated circuit containing a high-speed interface circuit for transferring serial data. SOLUTION: This semiconductor integrated circuit is equipped with a clock signal creation circuit which generates a multiple clock signal and a plurality of multiphase clock signals having a frequency of integral submultiple of that of the multiple clock signal and different phases each other, a parallel/serial conversion circuit which synchronizes parallel data to the multiple clock signal and converts the data into serial data, a differential signal output circuit which outputs the serial data outside as a differential signal, a plurality of holding circuits which synchronize each data included in the serial data into the multiphase clock signal and hold each data sequentially, and a plurality of output circuits which output each data held by the plurality of holding circuits outside according to an output control signal, respectively. COPYRIGHT: (C)2007,JPO&INPIT
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