发明名称 ELEMENT TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To solve one or more problems selected from a group of the following: equalizing ripple current of an element, such as each capacitor; making the current of an alternating-current power supply into necessary minimum; making a bias voltage into necessary minimum; equalizing the bias voltage applied to an element; and removing a voltage balance resistance, regarding a test of an element, such as a capacitor using the ripple current. SOLUTION: This device comprises a first power supply (alternating-current power supply 6) which applies the ripple current to the elements (for example, capacitors C1-C6), a second power supply (direct current bias power supply 8) which applies a bias voltage to the elements, and a bias element which passes a direct current and blocks an alternating current. The elements are connected in series for the first power supply, and are connected to the second power supply in parallel through the bias element. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007155599(A) 申请公布日期 2007.06.21
申请号 JP20050353538 申请日期 2005.12.07
申请人 NF CORP 发明人 KASAHARA MASAFUMI
分类号 G01R31/00;H01G13/00 主分类号 G01R31/00
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