| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for examining samples, capable of attaining optimum imaging. SOLUTION: The method for examining the sample by using a microscope comprises steps of generating spatially coherent light in at least one continuous or continuously tunable wavelength range for illumination of the sample; selecting one or more wavelengths or wavelength ranges of the illumination light according to the sample and/or a prespecified method of examination; illuminating the sample with the illumination light with the selected wavelengths or wavelength ranges; separating the illumination light and the emission light, coming from the sample, into different light paths; removing the illumination light, radiated back by the sample before detection in a detection light path; and detecting the emitted light. In such a manner, selection of the wavelengths or the wavelength ranges of the illumination light is tuned by means of the suppression of the illumination light, and separation of the detection light and the illumination light, such that a prespecified control variable (R) assumes a maximum. COPYRIGHT: (C)2007,JPO&INPIT
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