| 摘要 |
A burn-in test apparatus and a method of a semiconductor device are provided to reduce a testing time and to enhance the exactness of testing by making sequentially all word lines enabled per each bank and performing a burn-in test per each bank in multi-bit test mode. Word lines selected from each memory bank(BANK0 to BANK3) are simultaneously enabled and predetermined data for a burn-in test are simultaneously written in memory cells connected with the selected word lines. At this time, all the word lines of each memory bank are sequentially enabled and written. The selected word lines of each memory bank are simultaneously enabled and the predetermined data for the burn-in test are simultaneously read from the memory cells connected with the selected word lines. At this time, all the word lines of each memory bank are sequentially enabled and read. The existence of failures in the memory cells is determined by using the read data.
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