| 摘要 |
In the microanalysis of a sample face, the signals generated by X-rays reflected by said sample during scanning thereof by an electron beam, are applied to a counter, the output signals of which are applied to a comparator which is set to a desired limit range. Output signals pertaining to subsequent intervals and obtained from said comparator are applied to an additional comparator the output of which, in turn, is connected to a recording device or the like.
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