发明名称 RESIN FOR PHOTORESIST COMPOSITION, PHOTORESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
摘要 A resin for photoresist compositions is disclosed with excellent resolution and line edge roughness characteristics. A photoresist composition and a method for forming a resist pattern using such a resin are also disclosed. The resin has a hydroxyl group bonded to a carbon atom at a polymer terminal, and the carbon atom in the α-position to the hydroxyl group has at least one electron attractive group.
申请公布号 KR100730531(B1) 申请公布日期 2007.06.20
申请号 KR20057022911 申请日期 2005.11.30
申请人 发明人
分类号 G03F7/004;G03F7/033;C08F2/38;C08F220/28;G03F7/039;H01L21/027;H01L21/30 主分类号 G03F7/004
代理机构 代理人
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