Method and apparatus for nondestructive evaluation of insulative coating

摘要

An apparatus (10) is provided for determining thickness and thermal conductivity for an insulative coating (14) disposed on a substrate (16) in an object (12). The apparatus includes a source (20) for rapidly applying a multiple optical pulses (24) on a surface of the object (12), where the surface comprises the insulative coating (14). The system further includes a recording system (28) configured to collect data (26) representative of the propagation of the optical pulses in the object (12). The apparatus further includes a processor (34) coupled to the recording system (28) and configured to receive the data (36) from the recording system (28) and configured to determine a thickness value and a thermal conductivity value for the insulative coating (14).