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发明名称
内连线结构及其制造方法、半导体装置
摘要
本发明提供一种铜内连线结构以做为内连线。上述内连结构具有一铜凹陷,其位于以铜填入位于一介电层中的一介层孔/沟槽的一镶嵌结构中。再者,上述内连线结构也可以具有一金属覆盖层,填入上述铜凹陷中。
申请公布号
TW200723448
申请公布日期
2007.06.16
申请号
TW095125785
申请日期
2006.07.14
申请人
台湾积体电路制造股份有限公司
发明人
石健学;蔡明兴;苏鸿文
分类号
H01L21/768(2006.01)
主分类号
H01L21/768(2006.01)
代理机构
代理人
洪澄文;颜锦顺
主权项
地址
新竹市新竹科学工业园区力行六路8号
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