发明名称 RESIST PATTERN THICKENING MATERIAL, PROCESS FOR FORMING RESIST PATTERN, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a resist pattern thickening material that can utilize ArF excimer laser light, can thicken a resist without depending on the size, has superior etching durability and can efficiently, easily and inexpensively form a fine resist space pattern that exceeds the exposure limits, and to provide a process for forming a resist pattern, a semiconductor device and a method for manufacturing the device. SOLUTION: The material contains resin and a compound expressed by general Formula (1). In the Formula (1), R represents a cyclic structure compound; X represents a monovalent organic group, containing a carboxyl group; Y represents a hydroxyl group, alkyl group, alkoxy group, amino group, alkyl-substituted amino group, carbonyl group or alkoxy carbonyl group; m represents an integer of 1 or larger; and n represents an integer of 0 or larger. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007148272(A) 申请公布日期 2007.06.14
申请号 JP20050345920 申请日期 2005.11.30
申请人 FUJITSU LTD 发明人 OZAWA YOSHIKAZU;NOZAKI KOJI
分类号 G03F7/40 主分类号 G03F7/40
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