INTERFEROMETRIC SAMPLE MEASUREMENT

摘要

The invention relates to a device for the interferometric measurement of a sample, in particular the eye, comprising an interferometer arrangement which comprises a first measurement beam path, through which a measurement beam falls onto the sample, and a first reference beam path, through which a reference beam runs, which is applied to the measuring beam for interference. The interferometer arrangement comprises a second measuring beam path and/or second reference beam path, whereby the optical wave lengths thereof are different from one of the first beam paths. The wave length difference is selected according to a distance of two measuring areas which are arranged at a distance in the depth direction of the sample.