发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a non-volatile semiconductor memory device capable of increasing the contacting area between a semiconductor substrate in a cell array and wiring while reducing a variation in contact resistance, and to provide its manufacturing method. SOLUTION: In an NOR flash memory, regions between rows in the cell array with cell transistors MC have contacts for connecting the semiconductor substrate to the wiring of its upper layer, are arranged in a shape of rows, and insulated and separated by trench type element separating regions STI. The height of an oxide film 11 embedded into an element separating region neighboring to the contact DC is lower than those of embedded oxide films in the element separating regions neighbored to the channel regions CH of the cell transistors, and equal to those of the semiconductor substrates in the channel regions. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007149963(A) 申请公布日期 2007.06.14
申请号 JP20050342289 申请日期 2005.11.28
申请人 TOSHIBA CORP 发明人 FUJIMOTO HIROMASA
分类号 H01L21/8247;H01L21/76;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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