发明名称 |
PROBE, SPECIFIC MATERIAL ANALYZER, AND SPECIFIC MATERIAL ANALYSIS METHOD |
摘要 |
PROBLEM TO BE SOLVED: To analyze a specific material highly accurately by measuring accurately the weight of the fine specific material such as a protein correlatively with an actual adhesion state. SOLUTION: A probe 2 includes: a lever part 10 formed flatly with a prescribed thickness and extended in one direction from the base end side toward the tip side; a thin film 11 installed on the main face 10a of the lever part, to which a specific material DNA adheres by being reacted therewith; a holder part 12 for supporting the base end side of the lever part in the cantilever state; and a displacement measuring means 13 for measuring displacement of the lever part. In the probe 2, the thin film is a thin film acquired by exfoliating a layered material laminated in the multilayered state. COPYRIGHT: (C)2007,JPO&INPIT
|
申请公布号 |
JP2007147353(A) |
申请公布日期 |
2007.06.14 |
申请号 |
JP20050339934 |
申请日期 |
2005.11.25 |
申请人 |
SEIKO INSTRUMENTS INC |
发明人 |
WATANABE NAOYA;INOUE AKIRA |
分类号 |
G01N5/02;C12M1/00;G01Q60/24;G01Q80/00 |
主分类号 |
G01N5/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|