发明名称 PROBE, SPECIFIC MATERIAL ANALYZER, AND SPECIFIC MATERIAL ANALYSIS METHOD
摘要 PROBLEM TO BE SOLVED: To analyze a specific material highly accurately by measuring accurately the weight of the fine specific material such as a protein correlatively with an actual adhesion state. SOLUTION: A probe 2 includes: a lever part 10 formed flatly with a prescribed thickness and extended in one direction from the base end side toward the tip side; a thin film 11 installed on the main face 10a of the lever part, to which a specific material DNA adheres by being reacted therewith; a holder part 12 for supporting the base end side of the lever part in the cantilever state; and a displacement measuring means 13 for measuring displacement of the lever part. In the probe 2, the thin film is a thin film acquired by exfoliating a layered material laminated in the multilayered state. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007147353(A) 申请公布日期 2007.06.14
申请号 JP20050339934 申请日期 2005.11.25
申请人 SEIKO INSTRUMENTS INC 发明人 WATANABE NAOYA;INOUE AKIRA
分类号 G01N5/02;C12M1/00;G01Q60/24;G01Q80/00 主分类号 G01N5/02
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