发明名称 METHOD AND SYSTEM FOR DOUBLE-SIDED PATTERNING OF SUBSTRATES
摘要 The present invention is directed towards a method and a system of patterning first and second opposed sides of a substrate. The method and system may employ a mold assembly and obtaining a desired spatial relationship between the first and second opposed sides of the substrate and the mold assembly. In a further embodiment, the method and system may employ a first and a second mold assembly.
申请公布号 WO2007067488(A2) 申请公布日期 2007.06.14
申请号 WO2006US46256 申请日期 2006.11.30
申请人 MOLECULAR IMPRINTS, INC. 发明人 CHOI, BYUNG-JIN;SREENIVASAN, SIDLGATA V.
分类号 B29C35/02 主分类号 B29C35/02
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