发明名称 CHEMICAL MECHANICAL POLISHING SLURRY USEFUL FOR COPPER SUBSTRATE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing slurry and a method of polishing a substrate using the slurry, which can polish the substrate having a metal in a reproducible and tolerable speed. <P>SOLUTION: The present invention relates to the chemical mechanical polishing slurry comprising an oxidizing agent, a complexing agent, an abrasive, and an optional surfactant, as well as the method for using the chemical mechanical polishing slurry to remove copper alloy, titanium, titanium nitride, tantalum and tantalum nitride containing layers from the substrate. The slurry does not include a separate film-forming agent. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007150341(A) 申请公布日期 2007.06.14
申请号 JP20070008250 申请日期 2007.01.17
申请人 CABOT MICROELECTRONICS CORP 发明人 KAUFMAN VLASTA BRUSIC;KISTLER RODNEY C;WANG SHUMIN
分类号 H01L21/304;B24B37/00;C09G1/02;C09K3/14;H01L21/306;H01L21/321 主分类号 H01L21/304
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