发明名称 Field effect transistors having elevated source/drain regions and methods of manufacturing the same
摘要 Methods of manufacturing a field effect transistor include forming a gate pattern on a substrate. A gate spacer is formed on a sidewall of the gate pattern. A first layer is formed from a surface of the substrate and contacting the gate spacer using a first selective epitaxial growth (SEG) process at a first temperature. A second layer is formed from a surface of the first layer and contacting the gate spacer using a second SEG process at a second temperature. The second temperature is lower than the first temperature. The first and second layers define elevated source/drain regions.
申请公布号 US2007134880(A1) 申请公布日期 2007.06.14
申请号 US20060636139 申请日期 2006.12.08
申请人 KANG MIN-GU;KIM KI-HONG;KIM JIN-BUM;WON JUNG-YUN;JUNG IN-SUN 发明人 KANG MIN-GU;KIM KI-HONG;KIM JIN-BUM;WON JUNG-YUN;JUNG IN-SUN
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址