发明名称 PROBE CARD
摘要 PROBLEM TO BE SOLVED: To provide a probe card achieving cost reduction and making an ingenious plan to apply local magnetic fields and high-frequency magnetic fields to a magnetic field sensing section at high accuracy. SOLUTION: The probe card is characterized by including a substrate 11 supporting a probe pin 4 and an electromagnet 8 which, when the probe pin 4 supported by the substrate 11 contact a magnetic sensor terminal 74 of a single chip on a wafer 7, supplies magnetic force to a magnetic field sensing section 72 of the identical chip with the chip. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007147568(A) 申请公布日期 2007.06.14
申请号 JP20050346124 申请日期 2005.11.30
申请人 FUJITSU LTD 发明人 MURATA HISANORI
分类号 G01R33/12;G01R1/06;G01R31/302;G01R35/00;H01L21/66 主分类号 G01R33/12
代理机构 代理人
主权项
地址