发明名称 |
TRANSISTOR COMPRISING LAYERS OF SILICON DIOXIDE AND SILICON NITRIDE |
摘要 |
A semiconductor structure in which a substrate having surface regions of opposite type conductivity is covered with two different insulating layers. In a specific structure, the regions in the substrate form an isolated gate field effect transistor with a thin layer of silicon nitride forming the insulation in the gate portion and a thicker layer of silicon dioxide forming the insulation over the remainder of the device.
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申请公布号 |
US3707656(A) |
申请公布日期 |
1972.12.26 |
申请号 |
USD3707656 |
申请日期 |
1971.02.19 |
申请人 |
INTERN. BUSINESS MACHINES CORP. |
发明人 |
DAVID DEWITT |
分类号 |
H01L21/28;H01L23/29;H01L27/00;H01L27/07;H01L29/00;H01L29/06;H01L29/40;(IPC1-7):H01L11/14 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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