发明名称 TRANSISTOR COMPRISING LAYERS OF SILICON DIOXIDE AND SILICON NITRIDE
摘要 A semiconductor structure in which a substrate having surface regions of opposite type conductivity is covered with two different insulating layers. In a specific structure, the regions in the substrate form an isolated gate field effect transistor with a thin layer of silicon nitride forming the insulation in the gate portion and a thicker layer of silicon dioxide forming the insulation over the remainder of the device.
申请公布号 US3707656(A) 申请公布日期 1972.12.26
申请号 USD3707656 申请日期 1971.02.19
申请人 INTERN. BUSINESS MACHINES CORP. 发明人 DAVID DEWITT
分类号 H01L21/28;H01L23/29;H01L27/00;H01L27/07;H01L29/00;H01L29/06;H01L29/40;(IPC1-7):H01L11/14 主分类号 H01L21/28
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