| 摘要 |
PROBLEM TO BE SOLVED: To achieve an IC tester which can perform measurement with high resolution and high precision without using an offset subtractor. SOLUTION: The improved IC tester for measuring the output of an object under test by an A/D converter includes a voltage generation section for providing the A/D convertor with a maximum reference voltage and a minimum reference voltage variably on the basis of the output of the object under test. COPYRIGHT: (C)2007,JPO&INPIT
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