发明名称 Hafnium tantalum titanium oxide films
摘要 Embodiments of a dielectric layer containing a hafnium tantalum titanium oxide film structured as one or more monolayers include the dielectric layer disposed in an integrated circuit. Embodiments of methods of fabricating such a dielectric layer provide a dielectric layer for use in a variety of electronic devices. An embodiment may include forming hafnium tantalum titanium oxide film using atomic layer deposition.
申请公布号 US2007134942(A1) 申请公布日期 2007.06.14
申请号 US20050297741 申请日期 2005.12.08
申请人 MICRON TECHNOLOGY, INC. 发明人 AHN KIE Y.;FORBES LEONARD
分类号 H01L21/31 主分类号 H01L21/31
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