| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection machine capable of managing efficiently inspection result data. <P>SOLUTION: The inspection machine includes an inspection machine body 2 for inspecting a substrate loaded with electronic components; a defective substrate data acquisition means for acquiring data of a defective substrate determined to include a defective portion from among the inspection result data acquired by inspection by the inspection machine body 2; a preserved data generation means for taking image data of the whole substrate and image data of the defective portion from inside the defective substrate data, performing high compression of the whole substrate image data, and performing low compression (including non-compression) of the defective portion image data; and a data storage means for preserving the high-compression whole substrate image data and the low-compression defective portion image data. <P>COPYRIGHT: (C)2007,JPO&INPIT |
