摘要 |
A lithographic apparatus comprises a topography measurement device, a patterning device, and a corrective device. The topography measurement device measures a topography of at least one mechanical element of a patterning device. The patterning device comprises an array of individually controllable mechanical elements that are arranged to impart a pattern to a radiation beam. The corrective device corrects a mechanical property of the at least one mechanical element on the basis of information obtained by the topography measurement device.
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