发明名称 |
APPEARANCE INSPECTING DEVICE |
摘要 |
<p>[PROBLEMS] An appearance inspecting device for detecting a defect such as a scratch in the surface of an object to be inspected with an adequate resolution and judging the formed state of a film on the surface of the object while suppressing an increase of the throughput to an irreducible minimum. [MEANS FOR SOLVING PROBLEMS] An appearance inspecting device comprises an imaging unit (20) having line sensors (22R, 22G, 22B) having different color sensitivities and a processing unit (50). The processing unit (50) has pixel data acquiring means (S14) for acquiring pixel gray-scale data with a first pixel density from the gray-scale signal from a reference line sensor and acquiring pixel gray-scale data with a second pixel density lower than the first pixel density from the gray-scale signals from the line sensors other than the reference line sensor. Information representing the state of the surface of the object is created from the pixel gray-scale data acquired with the first pixel density and that acquired with the second pixel density.</p> |
申请公布号 |
WO2007066628(A1) |
申请公布日期 |
2007.06.14 |
申请号 |
WO2006JP324198 |
申请日期 |
2006.12.05 |
申请人 |
SHIBAURA MECHATRONICS CORPORATION;HAYASHI, YOSHINORI;MORI, HIDEKI |
发明人 |
HAYASHI, YOSHINORI;MORI, HIDEKI |
分类号 |
G01N21/956;H01L21/66;H04N5/335 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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