发明名称 APPEARANCE INSPECTING DEVICE
摘要 <p>[PROBLEMS] An appearance inspecting device for detecting a defect such as a scratch in the surface of an object to be inspected with an adequate resolution and judging the formed state of a film on the surface of the object while suppressing an increase of the throughput to an irreducible minimum. [MEANS FOR SOLVING PROBLEMS] An appearance inspecting device comprises an imaging unit (20) having line sensors (22R, 22G, 22B) having different color sensitivities and a processing unit (50). The processing unit (50) has pixel data acquiring means (S14) for acquiring pixel gray-scale data with a first pixel density from the gray-scale signal from a reference line sensor and acquiring pixel gray-scale data with a second pixel density lower than the first pixel density from the gray-scale signals from the line sensors other than the reference line sensor. Information representing the state of the surface of the object is created from the pixel gray-scale data acquired with the first pixel density and that acquired with the second pixel density.</p>
申请公布号 WO2007066628(A1) 申请公布日期 2007.06.14
申请号 WO2006JP324198 申请日期 2006.12.05
申请人 SHIBAURA MECHATRONICS CORPORATION;HAYASHI, YOSHINORI;MORI, HIDEKI 发明人 HAYASHI, YOSHINORI;MORI, HIDEKI
分类号 G01N21/956;H01L21/66;H04N5/335 主分类号 G01N21/956
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