发明名称 PATENT ANALYZING DEVICE, PATENT ANALYZING SYSTEM, PATENT ANALYZING METHOD AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide a patent analyzing device, a patent analyzing system and a patent analyzing method for providing words and phrases much more accurately expressing the summary of a published unexamined patent application. <P>SOLUTION: When acquiring a published unexamined patent application for analysis from a official gazette DB device 1 according to input information accepted by an input device 31, a main device 32 executes the language analysis processing of a document included in the published unexamined patent application for analysis, and extracts words and phrases(temporary subject word, temporary subject category) concerning a subject and words and phrases(temporary solution word, temporary solution category) concerning the solution method of the subject for every published unexamined patent application. Furthermore, the main device 32 acquires the explanatory sentence of the patent classification of the official gazette from a classification DB device 2 for every published unexamined patent application, and verifies and examines the validity of the words and phrases concerning the subject and words and phrases concerning the solution method of the subject by using the explanatory sentence of patent classification for every published unexamined patent application, and determines the words and phrases(subject word, subject category, solution word and solution category) expressing the summary of the published unexamined patent application for analysis. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007148630(A) 申请公布日期 2007.06.14
申请号 JP20050340266 申请日期 2005.11.25
申请人 NEC CORP 发明人 EMOTO SHINICHI;ARAI MASAHIKO
分类号 G06Q50/00;G06Q50/26 主分类号 G06Q50/00
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