发明名称 Phase-change random access memory device and method of operating the same
摘要 A phase-change random access memory device may include a phase-change pattern, a first electrode structure connected to the phase-change pattern, and a second electrode structure spaced apart from the first electrode structure and connected to the phase-change pattern, wherein at least one of the first electrode structure and the second electrode structure includes a plurality of resistor patterns connected to the phase-change pattern in parallel.
申请公布号 US2007133270(A1) 申请公布日期 2007.06.14
申请号 US20060515422 申请日期 2006.09.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEONG CHANG W.;LEE SU-YOUN;JEONG WON-CHEOL;PARK JAE-HYUN;AHN SU-JIN;YEUNG FAI
分类号 G11C11/00 主分类号 G11C11/00
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