发明名称 Herstellung einer Testkarte
摘要 A probe card includes a card plate (14) and a plurality of probe pins (16) fixed onto the card plate (14). Each of the probe pins (16) has a metallic body (32) made of rhenium-containing tungsten, and a nickel film (34) and a rhodium film (36) consecutively formed on the metallic body (32) by a plating technique using a liquid flow of a plating liquid. <IMAGE>
申请公布号 DE60120598(T2) 申请公布日期 2007.06.14
申请号 DE2001620598T 申请日期 2001.10.23
申请人 NEC ELECTRONICS CORP. 发明人 MIKAMI, KAZUNARI
分类号 G01R1/067;H01L21/66;C25D7/00;G01R1/073;H01L21/48;H01L23/485 主分类号 G01R1/067
代理机构 代理人
主权项
地址
您可能感兴趣的专利