| 摘要 |
<p>A test device improves process efficiency of adjusting a signal I/O timing. The test device includes a plurality of signal output units for outputting signals to be supplied to a DUT and a plurality of signal input units for inputting signals outputted by the device under test. The test device adjusts a signal I/O timing of signal output units and signal input units in each of the groups having two or more signal output units and two or more signal inputs units. The test device connects each of predetermined representative signal output units in each of the groups to a predetermined reference signal input unit among a plurality of signal input units, transmits a signal from each representative signal output unit to the reference signal input unit, measures a shift amount of the signal output timing of each representative signal output unit, and time-shifts the signal I/O timing of the signal output units and the signal input units in the group to which each representative signal output unit belongs so that the shift amount of each representative signal output unit is 0.</p> |
