发明名称 |
Storage efficient memory system with integrated BIST function |
摘要 |
A method and system is disclosed for conducting built-in-self-test (BIST) in a circuit under test. After allocating at least one memory segment with a predetermined size in at least one memory module as a test result module, the built-in-self-test is conducted for the circuit under test without testing the test result module. The test results are stored in the test result module.
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申请公布号 |
US2007136626(A1) |
申请公布日期 |
2007.06.14 |
申请号 |
US20050298127 |
申请日期 |
2005.12.09 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
CHUNG SHINE C. |
分类号 |
G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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